[n] P. Maheshwari et al., “SIMS and TEM Analysis of Niobium Bicrystals”, in Proc. SRF'11, Chicago, IL, USA, Jul. 2011, paper THPO028, pp. 776-780.
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Paper Title: SIMS and TEM Analysis of Niobium Bicrystals
Paper URL: https://jacow.org/SRF2011/papers/THPO028.pdf
Conference: 15th Int. Conf. RF Superconductivity (SRF'11)
Paper ID: THPO028
Location in proceedings: 776-780
Original Author String: P. Maheshwari, A.D. Batchelor, D.P. Griffis, F.A. Stevie, C. Zhou [NCSU AIF, Raleigh, North Carolina, USA] G. Ciovati, R. Myneni, J.K. Spradlin [JLAB, Newport News, Virginia, USA] M. Rigsbee [Materials Science and Engineering, Raleigh, USA]