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[n]	A-M. Valente-Feliciano et al., “RF and Structural Characterization of SRF Thin Films”, in Proc. 1st Int. Particle Accelerator Conf. (IPAC'10), Kyoto, Japan, May 2010, paper WEPEC077, pp. 3055-3057. 

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Paper Title: RF and Structural Characterization of SRF Thin Films
Paper URL: http://accelconf.web.cern.ch/IPAC10/papers/WEPEC077.pdf
Conference: 1st Int. Particle Accelerator Conf. (IPAC'10)
Paper ID: WEPEC077
Location in proceedings: 3055-3057
Original Author String: A-M. Valente-Feliciano, JLAB, Newport News, Virginia; D.B. Beringer, The College of William and Mary, Williamsburg; D. Gu, ODU, Norfolk, Virginia; R.A. Lukaszew, The College of William and Mary, Williamsburg; H.L. Phillips, C.E. Reece, JLAB, Newport News, Virginia; K.I. Seo, NSU, Newport News; J.K. Spradlin, B. Xiao, X. Zhao, JLAB, Newport News, Virginia

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