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Author: F. Le Pimpec


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Reference
T. Schietinger et al., “Commissioning Status of the SwissFEL Injector Test Facility”, in Proc. 2nd Int. Particle Accelerator Conf. (IPAC'11), San Sebastian, Spain, Sep. 2011, paper THPC095, pp. 3110-3112.
T. Schietinger et al., “Progress Report on the SwissFEL Injector Test Facility”, in Proc. 3rd Int. Particle Accelerator Conf. (IPAC'12), New Orleans, LA, USA, May 2012, paper TUPPP065, pp. 1747-1749.
J. Klavins et al., “Breakdown Localization Studies on the SwissFEL C-band Test Structures”, in Proc. 4th Int. Particle Accelerator Conf. (IPAC'13), Shanghai, China, May 2013, paper WEPFI058, pp. 2824-2826.
M. Pedrozzi et al., “First Measurement Results of the PSI 500kV Low Emittance Electron Source”, in Proc. 11th European Particle Accelerator Conf. (EPAC'08), Genoa, Italy, Jun. 2008, paper MOPC045, pp. 169-171.
Y. Kim et al., “Low Thermal Emittance Measurements at the PSI-XFEL Low Emittance Gun Test Facility”, in Proc. 30th Int. Free Electron Laser Conf. (FEL'08), Gyeongju, Korea, Aug. 2008, paper MOPPH055, pp. 110-113.
F. Le Pimpec, R. Ganter, C. Gough, C. P. Hauri, and M. Paraliev, “Comparison of High Gradient Achievement for Different Metals in DC and Pulsed DC Mode”, in Proc. 30th Int. Free Electron Laser Conf. (FEL'08), Gyeongju, Korea, Aug. 2008, paper TUPPH001, pp. 227-230.
R. Ganter et al., “Commissioning of a Diode / RF Photogun Combination”, in Proc. 31st Int. Free Electron Laser Conf. (FEL'09), Liverpool, UK, Aug. 2009, paper TUPC35, pp. 317-320.
C. Vicario et al., “Photocathode Drive Laser for SwissFEL”, in Proc. 32nd Int. Free Electron Laser Conf. (FEL'10), Malmö, Sweden, Aug. 2010, paper WEPB14, pp. 425-428.
M. Pedrozzi et al., “SwissFEL Injector Test Facility – Test and Plans”, in Proc. 33rd Int. Free Electron Laser Conf. (FEL'11), Shanghai, China, Aug. 2011, paper THPB30, pp. 625-628.
F. Le Pimpec, A. Adelmann, S. Reiche, R. Zennaro, and B. Grigoryan, “Dark Current Studies for SwissFEL”, in Proc. 34th Int. Free Electron Laser Conf. (FEL'12), Nara, Japan, Aug. 2012, paper MOPD36, pp. 105-108.
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